Applied Physics Express· 2014Q2
Development of X-ray-induced afterglow characterization system
- 506citations
- Q2SCImago
- 2014year
Short summary
A new system for characterizing X-ray-induced afterglow, featuring a pulse-width-tunable X-ray source and photon-counting detector, accurately measured afterglow time profiles of common scintillators.
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RadiationPhysics and Astronomy