Applied Physics Express· 2014Q2
Development of X-ray-induced afterglow characterization system
- 506citations
- Q2SCImago
- 2014year
Short summary
A new system for characterizing X-ray-induced afterglow, featuring a pulse-width-tunable X-ray source and photon-counting detector, accurately measured afterglow time profiles of common scintillators.
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Key points
- Developed an ionizing-radiation-induced luminescence characterization system for X-ray afterglow.
- System features a pulse-width-tunable X-ray source (nano- to millisecond) and photon-counting detector.
- Achieved a dynamic range of 10^6 for X-ray-induced afterglow.
- Successfully evaluated afterglow profiles of common scintillators (Bi4Ge3O12, CdWO4, CsI, Gd2O2S) with high accuracy.
AI-generated from the title and abstract; the full text is not read.
Abstract
To evaluate the X-ray-induced afterglow phenomenon, we developed an ionizing-radiation-induced luminescence characterization system equipped with a pulse-width-tunable X-ray source. The system consists of a pulse X-ray tube and a detector system based on photon counting. The excitation pulse width was tunable from nano- to millisecond ranges, and the dynamic range of the X-ray-induced afterglow was 106. Conventional scintillators for X-ray CT or security systems, namely, Bi4Ge3O12, CdWO4, Tl-doped CsI, and Tb and Pr-codoped Gd2O2S, were evaluated for the performance test. Results show that the afterglow time profiles of these scintillators are consistent with generally known results with high accuracy.
The authors' abstract, as published at the source. Applied Physics Express, 2014 · DOI ↗
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Field: Radiation
RadiationPhysics and Astronomy