Electronics· 2026Q2
Low-Profile Anisotropic Metasurface Absorber Enabled by N-Port-Network Inverse Design
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- Q2SCImago
- 2026year
Short summary
A novel N-port-network inverse design method creates a low-profile, anisotropic metasurface absorber with over 80% absorption across 5.24–6.03 GHz for both TE and TM polarizations, even at incidence angles up to 74°.
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Key points
- An N-port-network inverse design method is presented for anisotropic metasurface absorbers.
- The absorber is 3.2 mm thick and designed for the 5.2–5.9 GHz frequency range.
- Simulations show absorption ratio ≥ 0.8 for TE/TM polarizations from 5.24–6.03 GHz up to 74° incidence.
- Prototype measurements confirm absorption ratio ≥ 0.8 from 5.2–5.9 GHz at 7°, 60°, and 75° incidence.
AI-generated from the title and abstract; the full text is not read.
Abstract
An N-port-network method is presented for the inverse design of anisotropic metasurface absorbers. Internal discrete ports and four external transverse-electric (TE) and transverse-magnetic (TM) Floquet ports retain angle-dependent reference impedances and co- and cross-polarized responses. The third-generation nondominated sorting genetic algorithm (NSGA-III) searches port states and lumped-element choices. A planar metal-backed absorber with a nominal substrate thickness of 3.2 mm is designed over 5.2–5.9 GHz. Full-wave results satisfy an absorption ratio (AR) of at least 0.8 over approximately 5.24–6.03 GHz for both polarizations at the sampled incidence angles from 0° to 74° in the specified incidence plane. At 5.5 GHz, the incidence-plane azimuth sweep satisfies this threshold at all sampled azimuths up to 50° incidence. A 0.6m×0.6m prototype gives a reflection-derived AR of at least 0.8 over 5.2–5.9 GHz for both polarizations at 7°, 60°, and 75°. These finite-distance measurements are subject to illumination, collection, and normalization uncertainty and do not establish calibrated total absorption at grazing incidence.
The authors' abstract, as published at the source. Electronics, 2026 · DOI ↗
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Field: Electronic, Optical and Magnetic Materials
Electronic, Optical and Magnetic MaterialsMaterials Science