STAR Protocols· 2026Q2
Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy
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- Q2SCImago
- 2026year
Short summary
A new low-cost protocol, DRIFT-EM, enables direct wafer-based collection of ultrathin serial sections for volume electron microscopy.
AI-generated from the title and abstract; the full text is not read.
Key points
- Presents DRIFT-EM, a low-cost protocol for direct wafer-based collection of ultrathin serial sections.
- Includes steps for modifying diamond knives and constructing thermoplastic barriers.
- Details the use of static ionizers for section clearing.
- Incorporates automated region of interest mapping of collected sections.
AI-generated from the title and abstract; the full text is not read.
Abstract
Large-volume serial electron microscopy enables reconstructions of neural circuits at synaptic resolution but depends on reliable collection of large libraries of ultrathin sections. Here, we present a low-cost protocol for direct wafer-based section collection. We describe steps for modifying a commercial diamond knife, constructing thermoplastic barriers, mounting and tuning static ionizers for section clearing, and automated region of interest mapping of collected sections. For complete details on the use and execution of this protocol, please refer to Medina and Gogola et al. 1
The authors' abstract, as published at the source. STAR Protocols, 2026 · DOI ↗
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Field: Surfaces, Coatings and Films
Surfaces, Coatings and FilmsMaterials Science