eLife· 2018Q1
New tools for automated high-resolution cryo-EM structure determination in RELION-3
- 5,499citations
- Q1SCImago
- 2018year
Short summary
RELION-3 introduces automated tools for high-resolution cryo-electron microscopy (cryo-EM) structure determination, including CPU vector acceleration and reference-free autopicking for non-interactive processing.
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Key points
- RELION-3 adds CPU vector acceleration and GPU support for flexible resource use and to avoid memory limitations.
- Reference-free autopicking with Laplacian-of-Gaussian filtering enables non-interactive processing during data acquisition.
- Per-particle refinement of CTF parameters and beam tilt correction improve reconstruction resolution for particles at varying ice heights.
- Ewald sphere curvature correction further enhances resolution for large particles.
- These advancements, combined with Bayesian motion correction, yield resolution improvements of 0.2–0.7 Å.
AI-generated from the title and abstract; the full text is not read.
Abstract
Here, we describe the third major release of RELION. CPU-based vector acceleration has been added in addition to GPU support, which provides flexibility in use of resources and avoids memory limitations. Reference-free autopicking with Laplacian-of-Gaussian filtering and execution of jobs from python allows non-interactive processing during acquisition, including 2D-classification, de novo model generation and 3D-classification. Per-particle refinement of CTF parameters and correction of estimated beam tilt provides higher resolution reconstructions when particles are at different heights in the ice, and/or coma-free alignment has not been optimal. Ewald sphere curvature correction improves resolution for large particles. We illustrate these developments with publicly available data sets: together with a Bayesian approach to beam-induced motion correction it leads to resolution improvements of 0.2–0.7 Å compared to previous RELION versions.
The authors' abstract, as published at the source. eLife, 2018 · DOI ↗
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Field: Electrical and Electronic Engineering
Electrical and Electronic EngineeringEngineering