IEEE Transactions on Industrial Electronics· 2015Q1
An Improved Exponential Model for Predicting Remaining Useful Life of Rolling Element Bearings
- 661citations
- Q1SCImago
- 2015year
Short summary
An improved exponential model enhances remaining useful life (RUL) prediction for rolling element bearings by introducing an adaptive first predicting time (FPT) selection and using particle filtering to reduce random errors.
AI-generated from the title and abstract; the full text is not read.
Key points
- Introduces an adaptive FPT selection method using the 3σ interval.
- Utilizes particle filtering to reduce random errors in RUL prediction.
- Demonstrates improved RUL prediction accuracy over the original exponential model.
- Validated through simulations and four bearing degradation tests.
AI-generated from the title and abstract; the full text is not read.
Abstract
The remaining useful life (RUL) prediction of rolling element bearings has attracted substantial attention recently due to its importance for the bearing health management. The exponential model is one of the most widely used methods for RUL prediction of rolling element bearings. However, two shortcomings exist in the exponential model: 1) the first predicting time (FPT) is selected subjectively; and 2) random errors of the stochastic process decrease the prediction accuracy. To deal with these two shortcomings, an improved exponential model is proposed in this paper. In the improved model, an adaptive FPT selection approach is established based on the 3σ interval, and particle filtering is utilized to reduce random errors of the stochastic process. In order to demonstrate the effectiveness of the improved model, a simulation and four tests of bearing degradation processes are utilized for the RUL prediction. The results show that the improved model is able to select an appropriate FPT and reduce random errors of the stochastic process. Consequently, it performs better in the RUL prediction of rolling element bearings than the original exponential model.
The authors' abstract, as published at the source. IEEE Transactions on Industrial Electronics, 2015 · DOI ↗
Continue with a free account
Ask the paper: 3 free questions a day about this paper; save it, get its citation, new summaries every day for your field. Takeaways are Premium.
Continue free on the webSign in with Google or Apple; no card needed. You come back to this paper.
On your phone:
Field: Safety, Risk, Reliability and Quality
Safety, Risk, Reliability and QualityEngineering