All fields · Hardware and Architecture
JournalQ2· SCImago 2025
Microelectronics Reliability
ISSN 0026-2714
- Q2Quartile
- 115h-index
- 1papers summarised
About this journal
Microelectronics Reliability is a Q2 journal by SCImago Journal Rank (2025 data) and an h-index of 115. Most of its papers in the Pofolia pool fall under Hardware and Architecture. Pofolia holds AI summaries of 1 paper(s) from this journal; the most cited is “A robustness evaluation model for dynamic SEE testing in SRAM-based Xilinx UltraScale+…” (0 citations).
The quartile (Q1–Q4) is the journal's percentile position within its subject area by SCImago Journal Rank; Q1 is the top 25%. What is a Q1 journal? · What is the h-index?
Most-cited papers in Hardware and Architecture →
Papers we summarise from this journal
- A robustness evaluation model for dynamic SEE testing in SRAM-based Xilinx UltraScale+ Field-Programmable Gate Arrays (FPGAs)2026 · 0 citations
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